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Author Question: For which of the following faults in RAM will the checkerboard pattern test? A) Ability to store ... (Read 106 times)

luvbio

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on: Jul 28, 2018
For which of the following faults in RAM will the checkerboard pattern test?
 
  A) Ability to store both 0s and 1s. B) Short between adjacent cells.
  C) Dynamically introduced errors between cells. D) All of the above.

Question 2

The checksum method is used to test ________.
 
  A) EEPROM B) FPLA C) RAM D) ROM
Digital Electronics: A Systems Approach ¦ Floyd ¦ 1st Edition
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huda

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Reply #1 on: Jul 28, 2018
Answer to Question 1

D

Answer to Question 2

D


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