Author Question: For which of the following faults in RAM will the checkerboard pattern test? A) Ability to store ... (Read 106 times)

luvbio

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For which of the following faults in RAM will the checkerboard pattern test?
 
  A) Ability to store both 0s and 1s. B) Short between adjacent cells.
  C) Dynamically introduced errors between cells. D) All of the above.

Question 2

The checksum method is used to test ________.
 
  A) EEPROM B) FPLA C) RAM D) ROM


huda

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Answer to Question 1

D

Answer to Question 2

D



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