For which of the following faults in RAM will the checkerboard pattern test? A) Ability to store ...

Author Question: For which of the following faults in RAM will the checkerboard pattern test? A) Ability to store ... (Read 99 times)

luvbio

Hero Member
Posts: 623

on: Jul 28, 2018

For which of the following faults in RAM will the checkerboard pattern test?

A) Ability to store both 0s and 1s. B) Short between adjacent cells.
C) Dynamically introduced errors between cells. D) All of the above.

Question 2

The checksum method is used to test ________.

A) EEPROM B) FPLA C) RAM D) ROM

Digital Electronics: A Systems Approach ¦ Floyd ¦ 1^st Edition

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huda

Sr. Member
Posts: 304

Reply #1 on: Jul 28, 2018

Answer to Question 1

D

Answer to Question 2

D

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